The process capability index <italic>C</italic> _{<italic>pk</italic>} is widely used when measuring the capability of a manufacturing process. A process is defined to be capable if the capability index exceeds a stated threshold value, e.g. <italic>C</italic> _{<italic>pk</italic>}4/3. This inequality can be expressed graphically using a process capability plot,...

Pattern recognition applied to control charts centers around the development and assessment of automated algorithms for detecting non‐random or unnatural patterns in observations collected from a production process. The work presented here marks the first examination of enhancements to an...