Behseta, Sam; Kass, Robert E.; Wallstrom, Garrick L. - In: Biometrika 92 (2005) 2, pp. 419-434
In many applications of functional data analysis, summarising functional variation based on fits, without taking account of the estimation process, runs the risk of attributing the estimation variation to the functional variation, thereby overstating the latter. For example, the first eigenvalue...