Smith, L. Vanessa; Leybourne, Stephen; Kim, Tae-Hwan; … - In: Journal of Applied Econometrics 19 (2004) 2, pp. 147-170
Unit root tests, seeking mean or trend reversion, are frequently applied to panel data. We show that more powerful variants of commonly applied tests are readily available. Moreover, power gains persist when the modifications are applied to bootstrap procedures that may be employed when...