SANYAL, Panoma; JAFFE, Adam B. - In: Annales d'Economie et de Statistique (2005) 79-80, pp. 211-240
The explosion in the patenting rate in the U.S. during the last half of the 1990s is often attributed partly to an apparent decline in examination standards. We estimate a simultaneous equation model accounting for the fact that a decline in examination standards would itself induce an increase...
