Narrow search
Showing 1 - 8 of 8
Cover Image
Group Sequential Methods for an Ordinal Logistic Random-Effects Model Under Misspecification
Spiessens, Bart; Lesaffre, Emmanuel; Verbeke, Geert; … - In: Biometrics 58 (2002) 3, pp. 569-575
Persistent link: https://www.econbiz.de/10010946394
Cover Image
Nonignorable Models for Intermittently Missing Categorical Longitudinal Responses
Tsonaka, Roula; Rizopoulos, Dimitris; Verbeke, Geert; … - In: Biometrics 66 (2010) 3, pp. 834-844
Persistent link: https://www.econbiz.de/10010946809
Cover Image
A Two-Part Joint Model for the Analysis of Survival and Longitudinal Binary Data with Excess Zeros
Rizopoulos, Dimitris; Verbeke, Geert; Lesaffre, Emmanuel; … - In: Biometrics 64 (2008) 2, pp. 611-619
Persistent link: https://www.econbiz.de/10010946915
Cover Image
Sensitivity Analysis for Nonrandom Dropout: A Local Influence Approach
Verbeke, Geert; Molenberghs, Geert; Thijs, Herbert; … - In: Biometrics 57 (2001) 1, pp. 7-14
Persistent link: https://www.econbiz.de/10010947699
Cover Image
Smooth Random Effects Distribution in a Linear Mixed Model
Ghidey, Wendimagegn; Lesaffre, Emmanuel; Eilers, Paul - In: Biometrics 60 (2004) 4, pp. 945-953
Persistent link: https://www.econbiz.de/10010948186
Cover Image
A New Nonparametric Approach for Baseline Covariate Adjustment for Two-Group Comparative Studies
Schacht, Alexander; Bogaerts, Kris; Bluhmki, Erich; … - In: Biometrics 64 (2008) 4, pp. 1110-1116
Persistent link: https://www.econbiz.de/10010948197
Cover Image
A Semi-Parametric Shared Parameter Model to Handle Nonmonotone Nonignorable Missingness
Tsonaka, Roula; Verbeke, Geert; Lesaffre, Emmanuel - In: Biometrics 65 (2009) 1, pp. 81-87
Persistent link: https://www.econbiz.de/10010948505
Cover Image
A General Method for Dealing with Misclassification in Regression: The Misclassification SIMEX
Küchenhoff, Helmut; Mwalili, Samuel M.; Lesaffre, Emmanuel - In: Biometrics 62 (2006) 1, pp. 85-96
Persistent link: https://www.econbiz.de/10011036029