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Additive Biclustering: A Compa...
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Multiple Imputation for Model Checking: Completed-Data Plots with Missing and Latent Data
Gelman, Andrew
;
Mechelen, Iven Van
;
Verbeke, Geert
; …
- In:
Biometrics
61
(
2005
)
1
,
pp. 74-85
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