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~isPartOf:"Computers in industry : an international journal"
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Integration of machine-vision inspection information for best-matching of distributed components and suppliers
Velasquez, Juan D.
;
Nof, Shimon Y.
- In:
Computers in industry : an international journal
59
(
2008
)
1
,
pp. 69-81
Persistent link: https://www.econbiz.de/10003682865
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