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~isPartOf:"Economic modelling"
~isPartOf:"The journal of technology transfer"
~person:"Ji, Yongbao"
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TECHNOLOGY TRANSFER TO U.S. IN...
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Some comments on Antonelli and Quatraro's paper of measuring effect of biased technology on TFP
Ji, Yongbao
;
Wang, Yanping
- In:
The journal of technology transfer
39
(
2014
)
2
,
pp. 276-280
Persistent link: https://www.econbiz.de/10010342491
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