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~isPartOf:"Energy conversion and management : ECM"
~isPartOf:"IEEE transactions on reliability : R ; IEEE T R"
~person:"Kececioglu, D.B."
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Energy conversion and management : ECM
IEEE transactions on reliability : R ; IEEE T R
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PAPERS - Lifetime: Probabilistic Models and Statistical Inference - Fitting the Weibull Log-Linear Model to Accelerated Life-Test Data
Wang, W.
;
Kececioglu, D.B.
- In:
IEEE transactions on reliability : R ; IEEE T R
49
(
2000
)
2
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pp. 217-223
Persistent link: https://www.econbiz.de/10006622734
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