Defects on semiconductor wafers tend to cluster and the spatial defect patterns contain useful information about potential problems in the manufacturing process. This study proposes to use model-based clustering algorithms via Bayesian inferences for spatial defect pattern recognition on...

Burn-in is a manufacturing process applied to products to eliminate early failures in the factory before the products reach the customers. Various methods have been proposed for determining an optimal burn-in time of a non-repairable system or a repairable series system, assuming that system...