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Optimal burn-in for maximizing reliability of repairable non-series systems
Kim, Kyungmee O.; Kuo, Way - In: European journal of operational research : EJOR 193 (2009) 1, pp. 140-151
Persistent link: https://www.econbiz.de/10008161296
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Spatial defect pattern recognition on semiconductor wafers using model-based clustering and Bayesian inference
Yuan, Tao; Kuo, Way - In: European journal of operational research : EJOR 190 (2008) 1, pp. 228-240
Persistent link: https://www.econbiz.de/10007988355
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Model-based clustering for integrated circuit yield enhancement
Hwang, Jung Yoon; Kuo, Way - In: European journal of operational research : EJOR 178 (2007) 1, pp. 143-153
Persistent link: https://www.econbiz.de/10007391385
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A condition-based maintenance policy for degrading systems with age- and state-dependent operating cost
Liu, Bin; Wu, Shaomin; Xie, Min; Kuo, Way - In: European journal of operational research : EJOR 263 (2017) 3, pp. 879-887
Persistent link: https://www.econbiz.de/10011794458