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Determining the optimal probing lot size for the wafer probe operation in semiconductor manufacturing
Wang, Chih-hsiung - In: European journal of operational research : EJOR 197 (2009) 1, pp. 126-133
Persistent link: https://www.econbiz.de/10003828710
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Optimal lot sizing for products sold under free-repair warranty
Wang, Chih-Hsiung; Sheu, Shey-Heui - In: European journal of operational research : EJOR 149 (2003) 1, pp. 131-141
Persistent link: https://www.econbiz.de/10006651208
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Determining the optimal probing lot size for the wafer probe operation in semiconductor manufacturing
Wang, Chih-Hsiung - In: European journal of operational research : EJOR 197 (2009) 1, pp. 126-133
Persistent link: https://www.econbiz.de/10008175363
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Economic off-line quality control strategy with two types of inspection errors
Wang, Chih-Hsiung - In: European journal of operational research : EJOR 179 (2007) 1, pp. 132-147
Persistent link: https://www.econbiz.de/10007391320
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Feature cluster mathematical finance and risk assessment
Dohi, Tadashi (contributor) - In: European journal of operational research : EJOR 168,2 (2006)
Persistent link: https://www.econbiz.de/10004869909
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Mathematical Finance and Risk Assessment
Dohi, Tadashi; Osaki, Shunji; Nikolaos Limnios - In: European journal of operational research : EJOR 168 (2006) 2, pp. 279-280
Persistent link: https://www.econbiz.de/10006641234