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Comparison Analysis of Efficiency for Step-Down and Step-Up Stress Accelerated Life Testing
Wang, R; Sha, N; Gu, B; Xu, X - In: IEEE transactions on reliability : R ; IEEE T R 61 (2012) 2, pp. 590-604
Persistent link: https://www.econbiz.de/10009985680
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Software - Effective Software Fault Localization Using an RBF Neural Network
Wong, W E; Debroy, V; Golden, R; Xu, X; Thuraisingham, B - In: IEEE transactions on reliability : R ; IEEE T R 61 (2012) 1, pp. 149-170
Persistent link: https://www.econbiz.de/10009844395