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International collaborative patterns in China's nanotechnology publications
Ye, Xuanting; Liu, Yun; Porter, Alan L. - In: International journal of technology management : IJTM 59 (2012) 3/4, pp. 255-272
Persistent link: https://www.econbiz.de/10009656791
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Study on the measurement of international knowledge flow based on the patent citation network
Ye, Xuanting; Zhang, Jian; Liu, Yun; Su, Jun - In: International journal of technology management : IJTM 69 (2015) 3/4, pp. 229-245
Persistent link: https://www.econbiz.de/10011586200
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Knowledge transfer efficiency measurement with application for open innovation networks
Su, Jiafu; Yu, Yang; Zhang, Xuefeng - In: International journal of technology management : IJTM 81 (2019) 1/2, pp. 118-142
Persistent link: https://www.econbiz.de/10012149136