Torng, Chau-Chen; Tseng, Chun-Chieh; Lee, Pei-Hsi - In: Journal of Applied Statistics 37 (2010) 6, pp. 955-967
A combination of double sampling the [image omitted] chart and the variable sampling interval of the [image omitted] chart (DSVSI [image omitted] chart) increases the sensitivity in the small shift detection. A usual assumption of control charts is that the process observations are...
