Lee, Andy; Yick, John; Hui, Yer Van - In: Journal of Applied Statistics 28 (2001) 6, pp. 691-702
The portmanteau statistic is commonly used for testing goodness-of-fit of time series models. However, this lack of fit test may depend on one or several atypical observations in the series. We investigate the sensitivity of the portmanteau statistic in the presence of additive outliers....