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A multi-level panel STAR model for US manufacturing sectors
Fok, Dennis; van Dijk, Dick; Franses, Philip Hans - In: Journal of applied econometrics 20 (2005) 6, pp. 811
Persistent link: https://www.econbiz.de/10006957873
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A multi-level panel star model for us manufacturing sectors
Fok, Dennis; Dijk, Dick van; Franses, Philip Hans - In: Journal of applied econometrics 20 (2005) 6, pp. 811-827
Persistent link: https://www.econbiz.de/10003168966
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A RANK‐ORDERED LOGIT MODEL WITH UNOBSERVED HETEROGENEITY IN RANKING CAPABILITIES
Fok, Dennis; Paap, Richard; Van Dijk, Bram - In: Journal of applied econometrics 27 (2012) 5, pp. 831-847
Persistent link: https://www.econbiz.de/10009994125
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Modeling category‐level purchase timing with brand‐level marketing variables
Fok, Dennis; Paap, Richard - In: Journal of applied econometrics 24 (2009) 3, pp. 469-490
Persistent link: https://www.econbiz.de/10008847126
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Modeling category-level purchase timing with brand-level marketing variables
Fok, Dennis; Paap, Richard - In: Journal of applied econometrics 24 (2009) 3, pp. 469-489
Persistent link: https://www.econbiz.de/10008225602
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A rank-ordered logit model with unobserved heterogeneity in ranking capabilities
Fok, Dennis; Paap, Richard; Dijk, Bram van - In: Journal of applied econometrics 27 (2012) 5, pp. 831-846
Persistent link: https://www.econbiz.de/10010219733
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Modeling category-level purchase timing with brand-level marketing variables
Fok, Dennis; Paap, Richard - In: Journal of applied econometrics 24 (2009) 3, pp. 469-489
Persistent link: https://www.econbiz.de/10003825045
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Testing for ARCH in the presence of addiative outliers
Dijk, Dick van; Franses, Philip Hans; Lucas, André - In: Journal of applied econometrics 14 (1999) 5, pp. 539-562
Persistent link: https://www.econbiz.de/10001421498
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Asympototically perfect and relative convergence of productivity
Hobijn, Bart; Franses, Philip Hans - In: Journal of applied econometrics 15 (2000) 1, pp. 59-81
Persistent link: https://www.econbiz.de/10001465104
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Deriving target selection rules from endogenously selected samples
Donkers, Bas; Paap, Richard; Jonker, Jedid-Jah; … - In: Journal of applied econometrics 21 (2006) 5, pp. 549-562
Persistent link: https://www.econbiz.de/10007289629