Narrow search
Showing 1 - 10 of 30
Cover Image
Testing for ARCH in the presence of addiative outliers
Dijk, Dick van; Franses, Philip Hans; Lucas, André - In: Journal of applied econometrics 14 (1999) 5, pp. 539-562
Persistent link: https://www.econbiz.de/10001421498
Cover Image
Special issue: Recent developments in business cycle analysis
Dijk, Dick van (contributor);  … - 2005
Persistent link: https://www.econbiz.de/10002728630
Cover Image
On the dynamics of business cycle analysis : editors' introduction
Dijk, Dick van; Dijk, Herman K. van; Franses, Philip Hans - In: Journal of applied econometrics 20 (2005) 2, pp. 147-150
Persistent link: https://www.econbiz.de/10002728682
Cover Image
A multi-level panel star model for us manufacturing sectors
Fok, Dennis; Dijk, Dick van; Franses, Philip Hans - In: Journal of applied econometrics 20 (2005) 6, pp. 811-827
Persistent link: https://www.econbiz.de/10003168966
Cover Image
Deriving target selection rules from endogenously selected samples
Donkers, Bas; Paap, Richard; Jonker, Jedid-Jah; … - In: Journal of applied econometrics 21 (2006) 5, pp. 549-562
Persistent link: https://www.econbiz.de/10007289629
Cover Image
Modelling and forecasting level shifts in absolute returns
Franses, Philip Hans; Van Der Leij, Marco; Paap, Richard - In: Journal of applied econometrics 17 (2002) 5, pp. 601
Persistent link: https://www.econbiz.de/10006970940
Cover Image
Introduction to the special issue on new econometric models in marketing
Chintagunta, Pradeep; Franses, Philip Hans; Paap, Richard - In: Journal of applied econometrics 24 (2009) 3, pp. 375-377
Persistent link: https://www.econbiz.de/10008847131
Cover Image
Introduction to the special issue on new econometric models in marketing
Chintagunta, Pradeep; Franses, Philip Hans; Paap, Richard - In: Journal of applied econometrics 24 (2009) 3, pp. 375-376
Persistent link: https://www.econbiz.de/10008225607
Cover Image
Censored latent effects autoregression, with an application to US unemployment
Franses, Philip Hans; Paap, Richard - In: Journal of applied econometrics 17 (2002) 4, pp. 347-366
Persistent link: https://www.econbiz.de/10001690455
Cover Image
Modelling and forecasting level shifts in absolute returns
Franses, Philip Hans; Leij, Marco van der; Paap, Richard - In: Journal of applied econometrics 17 (2002) 5, pp. 601-616
Persistent link: https://www.econbiz.de/10001709318