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More powerpul panel data unit root tests with an application to mean reversion in real exchange rates
Smith, L. Vanessa; Leybourne, Stephen James; Kim, Tae-hwan - In: Journal of applied econometrics 19 (2004) 2, pp. 147-170
Persistent link: https://www.econbiz.de/10002010349
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More powerful panel data unit root tests with an application to mean reversion in real exchange rates
Smith, L.Vanessa; Leybourne, Stephen; Kim, Tae-Hwan; … - In: Journal of applied econometrics 19 (2004) 2, pp. 147-170
Persistent link: https://www.econbiz.de/10006964453
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Tests for multiple forecast encompassing
Harvey, David I.; Newbold, Paul - In: Journal of applied econometrics 15 (2000) 5, pp. 471-482
Persistent link: https://www.econbiz.de/10001533562