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1
The significance of testing empirical non-nested models
McAleer, Michael
- In:
Journal of econometrics
67
(
1995
)
1
,
pp. 149-171
Persistent link: https://www.econbiz.de/10001333013
Saved in:
2
The econometrics of intellectual property : an overview
McAleer, Michael
- In:
Journal of econometrics
139
(
2007
)
2
,
pp. 237-241
Persistent link: https://www.econbiz.de/10003485352
Saved in:
3
Stationarity and the existence of moments of a family of GARCH processes
Ling, Shiqing
;
McAleer, Michael
- In:
Journal of econometrics
106
(
2002
)
1
,
pp. 109-117
Persistent link: https://www.econbiz.de/10001634306
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4
Moment-based estimation of smooth transition regression models with endogenous variables
Areosa, Waldyr Dutra
;
McAleer, Michael
;
Medeiros, Marcelo C.
- In:
Journal of econometrics
165
(
2011
)
1
,
pp. 100-111
Persistent link: https://www.econbiz.de/10009374482
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5
Moment restriction-based econometric methods : an overview
Kunitomo, Naoto
;
McAleer, Michael
;
Nishiyama, Yoshihiko
- In:
Journal of econometrics
165
(
2011
)
1
,
pp. 1-4
Persistent link: https://www.econbiz.de/10009374510
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6
A neural network demand system with heteroskedastic errors
McAleer, Michael
;
Medeiros, Marcelo C.
;
Slottje, Daniel …
- In:
Journal of econometrics
147
(
2008
)
2
,
pp. 359-371
Persistent link: https://www.econbiz.de/10003809381
Saved in:
7
An alternative approach to estimating demand : neural network regression with conditional volatility for high frequency air passenger arrivals
Medeiros, Marcelo C.
;
McAleer, Michael
;
Slottje, Daniel …
- In:
Journal of econometrics
147
(
2008
)
2
,
pp. 372-383
Persistent link: https://www.econbiz.de/10003809387
Saved in:
8
The econometrics of intellectual property : an overview
McAleer, Michael
(
contributor
)
-
2007
Persistent link: https://www.econbiz.de/10003485347
Saved in:
9
An econometric analysis of asymmetric volatility : theory and application to patents
McAleer, Michael
;
Chan, Felix
;
Marinova, Dora
- In:
Journal of econometrics
139
(
2007
)
2
,
pp. 259-284
Persistent link: https://www.econbiz.de/10003485356
Saved in:
10
Patent activity and technical change
Basmann, R. L.
;
McAleer, Michael
;
Slottje, Daniel Jonathan
- In:
Journal of econometrics
139
(
2007
)
2
,
pp. 355-375
Persistent link: https://www.econbiz.de/10003485371
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