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Knowledge spillovers in US patents : a dynamic patent intensity model with secret common innovation factors
Blazsek, Szabolcs; Escribano, Álvaro - In: Journal of econometrics 159 (2010) 1, pp. 14-32
Persistent link: https://www.econbiz.de/10008839946
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Decompositions of profitability change using cost functions
Diewert, Walter E. - In: Journal of econometrics 183 (2014) 1, pp. 58-66
Persistent link: https://www.econbiz.de/10010506088
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Determinants of firm-level domestic sales and exports with spillovers : evidence from China
Baltagi, Badi H.; Egger, Peter; Kesina, Michaela - In: Journal of econometrics 199 (2017) 2, pp. 184-201
Persistent link: https://www.econbiz.de/10011897671
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Research and development, competition and innovation : pseudo-maximum likelihood and simulated maximum likelihood methods applied to count data models with heterogeneity
Crépon, Bruno - In: Journal of econometrics 79 (1997) 2, pp. 355-378
Persistent link: https://www.econbiz.de/10001335918
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Individual effects and dynamics in count data models
Blundell, Richard W.; Griffith, Rachel; Windmeijer, Frank - In: Journal of econometrics 108 (2002) 1, pp. 113-131
Persistent link: https://www.econbiz.de/10001656604
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An econometric analysis of asymmetric volatility : theory and application to patents
McAleer, Michael; Chan, Felix; Marinova, Dora - In: Journal of econometrics 139 (2007) 2, pp. 259-284
Persistent link: https://www.econbiz.de/10003485356
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High-tech capital formation and economic performance in US manufacturing industries : an exploratory analysis
Berndt, Ernst R. - In: Journal of econometrics 65 (1995) 1, pp. 9-43
Persistent link: https://www.econbiz.de/10001173109
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Firm productivity in Israeli industry : 1979 - 1988
Griliches, Zvi - In: Journal of econometrics 65 (1995) 1, pp. 175-203
Persistent link: https://www.econbiz.de/10015118043
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Bayesian inference and state number determination for hidden Markov models : an application to the information content of the yield curve about inflation
Chopin, Nicolas; Pelgrin, Florian - In: Journal of econometrics 123 (2004) 2, pp. 327-344
Persistent link: https://www.econbiz.de/10002361750
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Skill-biased technical change in US manufacturing : a general index approach
Baltagi, Badi H.; Rich, Daniel P. - In: Journal of econometrics 126 (2005) 2, pp. 549-570
Persistent link: https://www.econbiz.de/10002647899