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~isPartOf:"NBER Working Paper"
~person:"Putnam, Jonathan"
~subject:"Patentrecht"
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How to Count Patents and Value Intellectual Property : Uses of Patent Renewal and Application Data
Lanjouw, Jean O.
;
Pakes, Ariel
;
Putnam, Jonathan
-
2021
improve on counts in studies which require a measure of the extent of
innovation
. A simple renewal based weighting scheme is …
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