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Spurious rejections by Perron tests in the presence of a break
Kim, Tae-hwan; Leybourne, Stephen James; Newbold, Paul - In: Oxford bulletin of economics and statistics 62 (2000) 3, pp. 433-444
Persistent link: https://www.econbiz.de/10001505515
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Regression-based tests for a change in persistence
Leybourne, Stephen James; Kim, Tae-hwan; Taylor, Robert - In: Oxford bulletin of economics and statistics 68 (2006) 5, pp. 595-621
Persistent link: https://www.econbiz.de/10003379177
Cover Image
Spurious Rejections by Perron Tests in the Presence of a Break
Kim, Tae-Hwan; Leybourne, Stephen J.; Newbold, Paul - In: Oxford bulletin of economics and statistics 62 (2000) 3, pp. 433-444
Persistent link: https://www.econbiz.de/10006452793
Cover Image
Regression-based Tests for a Change in Persistence
Leybourne, Stephen J.; Kim, Tae-Hwan; Taylor, A.M.Robert - In: Oxford bulletin of economics and statistics 68 (2006) 5, pp. 595-622
Persistent link: https://www.econbiz.de/10007292986