Narrow search
Showing 1 - 10 of 10
Cover Image
Using Profile Monitoring Techniques for a Data-rich Environment with Huge Sample Size
Wang, Kaibo; Tsung, Fugee - In: Quality and reliability engineering international 21 (2005) 7, pp. 677-688
Persistent link: https://www.econbiz.de/10006361380
Cover Image
Quality, Statistics, and Reliability Cluster at INFORMS 2003
Tsung, Fugee; Nembhard, Harriet Black - In: Quality and reliability engineering international 21 (2005) 7, pp. iii
Persistent link: https://www.econbiz.de/10006361382
Cover Image
Autocorrelated SPC for Non-Normal Situations
Castagliola, Philippe; Tsung, Fugee - In: Quality and reliability engineering international 21 (2005) 2, pp. 131-162
Persistent link: https://www.econbiz.de/10006363639
Cover Image
Monitoring autocorrelated processes using variable sampling schemes at fixed-times
Zou, Changliang; Wang, Zhaojun; Tsung, Fugee - In: Quality and reliability engineering international 24 (2008) 1, pp. 55-70
Persistent link: https://www.econbiz.de/10007906093
Cover Image
Adaptive charting schemes based on double sequential probability ratio tests
Li, Yan; Pu, Xiaolong; Tsung, Fugee - In: Quality and reliability engineering international 25 (2009) 1, pp. 21-40
Persistent link: https://www.econbiz.de/10008165039
Cover Image
An improved run-to-run process control scheme for categorical observations with misclassification errors
Shang, Yanfen; Wang, Kaibo; Tsung, Fugee - In: Quality and reliability engineering international 25 (2009) 4, pp. 397-408
Persistent link: https://www.econbiz.de/10008254253
Cover Image
A Comparative Study of Joint Monitoring Schemes for APC Processes
Jiang, Wei; Shu, Lianjie; Tsung, Fugee - In: Quality and reliability engineering international 22 (2006) 8, pp. 939-952
Persistent link: https://www.econbiz.de/10007383277
Cover Image
Relationships Among Control Charts Used with Feedback Control
Runger, George; Testik, Murat Caner; Tsung, Fugee - In: Quality and reliability engineering international 22 (2006) 8, pp. 877-888
Persistent link: https://www.econbiz.de/10007383281
Cover Image
Multiple Attribute Control Charts with False Discovery Rate Control
Li, Yanting; Tsung, Fugee - In: Quality and reliability engineering international 28 (2012) 8, pp. 857-871
Persistent link: https://www.econbiz.de/10010046799
Cover Image
An adaptive dimension reduction scheme for monitoring feedback-controlled processes
Wang, Kaibo; Tsung, Fugee - In: Quality and reliability engineering international 25 (2009) 3, pp. 283-298
Persistent link: https://www.econbiz.de/10008231872