Narrow search
Showing 1 - 10 of 34
Cover Image
Analyzing and Improving Measurement Systems: A Key to Effective Decision-making
Montgomery, Douglas C.; Brombacher, Aarnout C. - In: Quality and reliability engineering international 22 (2006) 3, pp. 237-238
Persistent link: https://www.econbiz.de/10006359452
Cover Image
Cost-constrained G-efficient Response Surface Designs for Cuboidal Regions
Park, Youjin; Montgomery, Douglas C.; Fowler, John W.; … - In: Quality and reliability engineering international 22 (2006) 2, pp. 121-140
Persistent link: https://www.econbiz.de/10006359695
Cover Image
Carol J. Feltz and David Newton
Montgomery, Douglas C.; Brombacher, Aarnout C. - In: Quality and reliability engineering international 22 (2006) 2, pp. 119-120
Persistent link: https://www.econbiz.de/10006359696
Cover Image
Changing of the Guard
Montgomery, Douglas C. - In: Quality and reliability engineering international 21 (2005) 1, pp. iii
Persistent link: https://www.econbiz.de/10006360263
Cover Image
Using Unreplicated 2k-p Designs for Characterizing Moderately Dimensioned Deterministic Computer Models
Houston, Dan; Ferreira, Susan; Montgomery, Douglas C. - In: Quality and reliability engineering international 21 (2005) 8, pp. 809-824
Persistent link: https://www.econbiz.de/10006360918
Cover Image
Generation III Six Sigma
Montgomery, Douglas C. - In: Quality and reliability engineering international 21 (2005) 6, pp. iii
Persistent link: https://www.econbiz.de/10006361604
Cover Image
A University-based Six Sigma Program
Montgomery, Douglas C.; Burdick, Richard K.; Lawson, … - In: Quality and reliability engineering international 21 (2005) 3, pp. 243-248
Persistent link: https://www.econbiz.de/10006363355
Cover Image
The Hierarchy Principle in Designed Industrial Experiments
Montgomery, Douglas C.; Myers, Raymond H.; Carter, Walter H. - In: Quality and reliability engineering international 21 (2005) 2, pp. 197-202
Persistent link: https://www.econbiz.de/10006363636
Cover Image
Generalized Linear Model-based Control Charts for Discrete Semiconductor Process Data
Skinner, Katina R.; Montgomery, Douglas C.; Runger, … - In: Quality and reliability engineering international 20 (2004) 8, pp. 777-786
Persistent link: https://www.econbiz.de/10006363926
Cover Image
A Genetic Algorithm Hybrid for Constructing Optimal Response Surface Designs
Drain, David; Carlyle, W.Matthew; Montgomery, Douglas C.; … - In: Quality and reliability engineering international 20 (2004) 7, pp. 637-650
Persistent link: https://www.econbiz.de/10006364178