LI, HONGXIA; LV, XIAOJUN; XI, JUNHUA; WU, XIN; MAO, QINAN; … - In: Surface Review and Letters (SRL) 21 (2014) 05, pp. 1450061-1
In this paper, we fabricated Pt/TiOx/ZnO/n+-Si structures by inserting TiOx interlayer between Pt top electrode (TE) and ZnO thin film for non-volatile resistive random access memory (ReRAM) applications. Effects of TiOx interlayer with different thickness on the resistance switching of...
