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Double robustness for complier parameters and a semi-parametric test for complier characteristics
Singh, Rahul; Sun, Liyang - In: The econometrics journal 27 (2024) 1, pp. 1-20
Persistent link: https://www.econbiz.de/10014528085
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Weak identification with many instruments
Mikusheva, Anna; Sun, Liyang - In: The econometrics journal 27 (2024) 2, pp. C1-C28
Persistent link: https://www.econbiz.de/10015046374