Narrow search
Showing 1 - 6 of 6
Cover Image
Multi-step ART1 algorithm for recognition of defect patterns on semiconductor wafers
Choi, Gyunghyun; Kim, Sung-hee; Ha, Chunghun; Bae, Suk Joo - In: International journal of production research 50 (2012) 12, pp. 3274-3287
Persistent link: https://www.econbiz.de/10009576046
Cover Image
A stochastic simulation-based holistic evaluation approach with DEA for vendor selection
Park, SeJoon; Ok, Changsoo; Ha, Chunghun - In: Computers & operations research : and their … 100 (2018), pp. 368-378
Persistent link: https://www.econbiz.de/10011930650
Cover Image
Asymptotic analysis of simultaneous damages in spatial Boolean models
Li, Haijun; Xu, Susan H.; Kuo, Way - In: Stochastic methods in reliability and risk management : …, (pp. 139-154). 2014
Persistent link: https://www.econbiz.de/10010238836
Cover Image
Importance measures in reliability and mathematical programming
Zhu, Xiaoyan; Kuo, Way - In: Stochastic methods in reliability and risk management : …, (pp. 241-267). 2014
Persistent link: https://www.econbiz.de/10010239325
Cover Image
A Birnbaum-importance based genetic local search algorithm for component assignment problems
Yao, Qingzhu; Zhu, Xiaoyan; Kuo, Way - In: Stochastic methods in reliability and risk management : …, (pp. 185-200). 2014
Persistent link: https://www.econbiz.de/10010239380
Cover Image
A condition-based maintenance policy for degrading systems with age- and state-dependent operating cost
Liu, Bin; Wu, Shaomin; Xie, Min; Kuo, Way - In: European journal of operational research : EJOR 263 (2017) 3, pp. 879-887
Persistent link: https://www.econbiz.de/10011794458