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The Use of the Component Influence Graph to Reduce the Size of Markovian Availability Problems
Devooght, J.; Tombuyses, B. - In: Reliability engineering & system safety 46 (1994) 3, pp. 237-244
Persistent link: https://www.econbiz.de/10006866142
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Automatic construction of Markov transition matrices under state and functional dependences
Tombuyses, B. - In: Reliability engineering & system safety 64 (1999) 1, pp. 49-58
Persistent link: https://www.econbiz.de/10006844578
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Reduction of the Markovian system by the influence graph method: Error bound and reliability computation
Tombuyses, B. - In: Reliability engineering & system safety 63 (1999) 1, pp. 1-12
Persistent link: https://www.econbiz.de/10006844889
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Computational efficiency of the continuous cell-to-cell mapping technique as a function of integration schemes
Tombuyses, B.; Aldemir, T. - In: Reliability engineering & system safety 58 (1997) 3, pp. 215-224
Persistent link: https://www.econbiz.de/10006849646
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Aggregation Methods for Reliability and Availability Calculations
Devooght, J.; Tombuyses, B. - In: Reliability engineering & system safety 51 (1996) 1, pp. 23-34
Persistent link: https://www.econbiz.de/10006855766
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Solving Markovian Systems of O.D.E. for Availability and Reliability Calculations
Tombuyses, B.; Devooght, J. - In: Reliability engineering & system safety 48 (1995) 1, pp. 47-56
Persistent link: https://www.econbiz.de/10006862006
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Probabilistic Dynamics: A Comparison Between Continuous Event Trees and a Discrete Event Tree Model
Smidts, C. - In: Reliability engineering & system safety 44 (1994) 2, pp. 189-206
Persistent link: https://www.econbiz.de/10006866218
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SOFTWARE-RELIABILITY -- MODEL EVALUATION - Software reliability modeling: An approach to early reliability prediction
Smidts, C.; Stutzke, M.; Stoddard, R. - In: IEEE transactions on reliability : R ; IEEE T R 47 (1998) 3, pp. 268-278
Persistent link: https://www.econbiz.de/10006627874
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Dynamic reliability: towards an integrated platform for probabilistic risk assessment
Labeau, P.E.; Smidts, C.; Swaminathan, S. - In: Reliability engineering & system safety 68 (2000) 3, pp. 219-254
Persistent link: https://www.econbiz.de/10006838104
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Short Communications - Identification of missing scenarios in ESDs using probabilistic dynamics
Swaminathan, S.; Smidts, C. - In: Reliability engineering & system safety 66 (1999) 3, pp. 275-280
Persistent link: https://www.econbiz.de/10006841463