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Integrated Importance Measure of Component States Based on Loss of System Performance
Si, S; Dui, H; Zhao, X; Zhang, S; Sun, S - In: IEEE transactions on reliability : R ; IEEE T R 61 (2012) 1, pp. 192-203
Persistent link: https://www.econbiz.de/10009844398
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Coordinating a Supply Chain With a Manufacturer-Owned Online Channel: A Dual Channel Model Under Price Competition
Ryan, J K; Sun, D; Zhao, X - In: IEEE transactions on engineering management : EM 60 (2013) 2, pp. 247-259
Persistent link: https://www.econbiz.de/10010115494
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State Distributions of Multi-State Consecutive-k Systems
Zhao, X; Xu, Y; Liu, F - In: IEEE transactions on reliability : R ; IEEE T R 61 (2012) 2, pp. 274-282
Persistent link: https://www.econbiz.de/10009985651
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Optimization Problems of a Parallel System With a Random Number of Units
Nakagawa, T; Zhao, X - In: IEEE transactions on reliability : R ; IEEE T R 61 (2012) 2, pp. 543-549
Persistent link: https://www.econbiz.de/10009985675
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Optimal Pricing and Capacity Investment for Delay-Sensitive Demand
Yu, D Z; Zhao, X; Sun, D - In: IEEE transactions on engineering management : EM 60 (2013) 1, pp. 124-136
Persistent link: https://www.econbiz.de/10010073255
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The Impact of Supply Chain Integration on Mass Customization Capability: An Extended Resource-Based View
Lai, F; Zhang, M; Lee, D M S; Zhao, X - In: IEEE transactions on engineering management : EM 59 (2012) 3, pp. 443-457
Persistent link: https://www.econbiz.de/10009998927
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Systems - Exact Reliability of a Linear Connected-(r,s)-out-of-(m,n): F System
Zhao, X; Cui, L; Zhao, W; Liu, F - In: IEEE transactions on reliability : R ; IEEE T R 60 (2011) 3, pp. 689-689
Persistent link: https://www.econbiz.de/10009289564
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Minimum-Distance Parametric Estimation Under Progressive Type-I Censoring
Balakrishnan, N; Bordes, L; Zhao, X - In: IEEE transactions on reliability : R ; IEEE T R 59 (2010) 2, pp. 413-426
Persistent link: https://www.econbiz.de/10008432102
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Developments and Applications of the Finite Markov Chain Imbedding Approach in Reliability
Cui, L; Xu, Y; Zhao, X - In: IEEE transactions on reliability : R ; IEEE T R 59 (2010) 4, pp. 685-691
Persistent link: https://www.econbiz.de/10008762920