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Modeling the dynamics of a sys...
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Cavalcante, C A V
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IEEE transactions on reliability : R ; IEEE T R
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Testing - Comparison of the Mean Time Between Failures for Two Systems Under Short Tests
Scarf, P A
;
Cavalcante, C A V
;
Dwight, R A
;
Gordon, P
- In:
IEEE transactions on reliability : R ; IEEE T R
58
(
2009
)
4
,
pp. 589-597
Persistent link: https://www.econbiz.de/10008340974
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Optimal Step-Stress Accelerated Degradation Test Plan for Gamma Degradation Processes
Scarf, P A
;
Cavalcante, C A V
;
Dwight, R A
;
Gordon, P
- In:
IEEE transactions on reliability : R ; IEEE T R
58
(
2009
)
4
,
pp. 611-619
Persistent link: https://www.econbiz.de/10008372280
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