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Coit, David W.
25
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6
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4
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3
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Reliability engineering & system safety
12
IIE transactions / Institute of Industrial Engineers, Norcross, Ga : industrial engineering and development
6
Computers & industrial engineering : CAIE ; an internat. journal
2
INFORMS journal on computing : JOC
2
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1
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1
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ECONIS (ZBW)
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1
Data survivability vs. security in information systems
Levitin, Gregory
;
Hausken, Kjell
;
Taboada, Heidi A.
; …
- In:
Reliability engineering & system safety
100
(
2012
),
pp. 19-28
Persistent link: https://www.econbiz.de/10009834101
Saved in:
2
Pruned Pareto-optimal sets for the system redundancy allocation problem based on multiple prioritized objectives
Kulturel-Konak, Sadan
;
Coit, David W.
;
Baheranwala, Fatema
- In:
Journal of heuristics
14
(
2008
)
4
,
pp. 335-358
Persistent link: https://www.econbiz.de/10008220983
Saved in:
3
A heuristic for solving the redundancy allocation problem for multi-state series-parallel systems
Ramirez-Marquez, Jose E.
;
Coit, David W.
- In:
Reliability engineering & system safety
83
(
2004
)
3
,
pp. 341-350
Persistent link: https://www.econbiz.de/10006818944
Saved in:
4
Approximating network reliability estimates using linear and quadratic unreliability of minimal cuts
Jin, Tongdan
;
Coit, David W.
- In:
Reliability engineering & system safety
82
(
2003
)
1
,
pp. 41-48
Persistent link: https://www.econbiz.de/10006821300
Saved in:
5
A HIGHLY EFFICIENT MONTE CARLO METHOD FOR ASSESSMENT OF SYSTEM RELIABILITY BASED ON A MARKOV MODEL
Mazumdar, Mainak
;
Coit, David W.
;
McBride, Kevin
- In:
American journal of mathematical and management sciences
19
(
1999
)
1-2
,
pp. 115-134
Persistent link: https://www.econbiz.de/10006841536
Saved in:
6
A Monte-Carlo simulation approach for approximating multi-state two-terminal reliability
Ramirez-Marquez, Jose E.
;
Coit, David W.
- In:
Reliability engineering & system safety
87
(
2005
)
2
,
pp. 253-264
Persistent link: https://www.econbiz.de/10006809973
Saved in:
7
A Method for Correlating Field Life Degradation with Reliability Prediction for Electronic Modules
Coit, David W.
;
Evans, John L.
;
Vogt, Nathan T.
; …
- In:
Quality and reliability engineering international
21
(
2005
)
7
,
pp. 715
Persistent link: https://www.econbiz.de/10006361377
Saved in:
8
Maximization of System Reliability with a Choice of Redundancy Strategies
Coit, David W.
- In:
IIE transactions / Institute of Industrial Engineers, …
35
(
2003
)
6
,
pp. 535-544
Persistent link: https://www.econbiz.de/10006170605
Saved in:
9
Efficiently Solving the Redundancy Allocation Problem Using Tabu Search
Kulturel-Konak, Sadan
;
Smith, Alice E.
;
Coit, David W.
- In:
IIE transactions / Institute of Industrial Engineers, …
35
(
2003
)
6
,
pp. 515-526
Persistent link: https://www.econbiz.de/10006170607
Saved in:
10
Gamma distribution parameter estimation for field reliability data with missing failure times
Coit, David W.
;
Jin, Tongdan
- In:
IIE transactions / Institute of Industrial Engineers, …
32
(
2000
)
12
,
pp. 1161-1166
Persistent link: https://www.econbiz.de/10006185928
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