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Statistical Inference from Start-Up Demonstration Test Data
Viveros, Roman; Balakrishnan, N. - In: Journal of quality technology : a quarterly journal of … 25 (1993) 2, pp. 119-130
Persistent link: https://www.econbiz.de/10006600755
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Relationships between moments of two related sets of order statistics and some extensions
Balakrishnan, N.; Govindarajulu, Z.; Balasubramanian, K. - In: Annals of the Institute of Statistical Mathematics : AISM 45 (1993) 2, pp. 243-248
Persistent link: https://www.econbiz.de/10006601059
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COMMENTS AND CORRECTIONS - Correction to "A Comparison of Two Simple Prediction Intervals for Exponentail Distribution"
Balakrishnan, N.; Lin, C.-T.; Chan, P.-S. - In: IEEE transactions on reliability : R ; IEEE T R 54 (2005) 2, pp. 366
Persistent link: https://www.econbiz.de/10006606820
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Lifetime Data Analysis - A Comparison of Two Simple Prediction Intervals for Exponential Distribution
Balakrishnan, N.; Lin, C.-T.; Chan, P.-S. - In: IEEE transactions on reliability : R ; IEEE T R 54 (2005) 1, pp. 27-33
Persistent link: https://www.econbiz.de/10006607719
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Estimation - Optimal Step-Stress Test Under Progressive Type-I Censoring
Gouno, E.; Sen, A.; Balakrishnan, N. - In: IEEE transactions on reliability : R ; IEEE T R 53 (2004) 3, pp. 388-393
Persistent link: https://www.econbiz.de/10006609044
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Estimation - Goodness-of-Fit Tests Based on Spacings for Progressively Type-II Censored Data From a General Location-Scale Distribution
Balakrishnan, N.; Ng, H.K.T.; Kannan, N. - In: IEEE transactions on reliability : R ; IEEE T R 53 (2004) 3, pp. 349-356
Persistent link: https://www.econbiz.de/10006609048
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Point and Interval Estimation for Gaussian Distribution, Based on Progressively Type-II Censored Samples
Balakrishnan, N.; Kannan, N.; Lin, C.T.; Ng, H.K.T. - In: IEEE transactions on reliability : R ; IEEE T R 52 (2003) 1, pp. 90-95
Persistent link: https://www.econbiz.de/10006614195
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PAPERS - Assessment of Reliability and Maintainability - Reliability Sampling Plans for Lognormal Distribution, Based on Progressively-Censored Samples
Balasooriya, U.; Balakrishnan, N. - In: IEEE transactions on reliability : R ; IEEE T R 49 (2000) 2, pp. 199-203
Persistent link: https://www.econbiz.de/10006622737
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BEST LINEAR UNBIASED AND MAXIMUM LIKELIHOOD ESTIMATION FOR EXPONENTIAL DISTRIBUTIONS UNDER GENERAL PROGRESSIVE TYPE-II CENSORED SAMPLES
Balakrishnan, N.; Sandhu, R.A. - In: Sankhya / B : the Indian journal of statistics 58 (1996) 1
Persistent link: https://www.econbiz.de/10006532082
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IDENTITIES FOR ORDER STATISTICS FROM NON-INDEPENDENT NON-IDENTICAL VARIABLES
Balasubramanian, K.; Balakrishnan, N.; Malik, H.J. - In: Sankhya / B : the Indian journal of statistics 56 (1994) 1, pp. 67-75
Persistent link: https://www.econbiz.de/10006538499