In this study, we reformulated the problem of wafer probe operation in semiconductor manufacturing to consider a probe machine (PM) which has a discrete Weibull shift distribution with a nondecreasing failure rate. To maintain the imperfect PM during the probing of a lot of wafers, a minimal...

This paper addresses statistical estimation problems of the optimal repair-cost limits minimizing the long-run average costs per unit time in discrete seting. Two discrete repair-cost limit replacement models with/without imperfect repair are considered. We derive the optimal repair-cost limits...