Lee, Hsiu-Mei; Lee, Wen-Chuan; Lei, Chia-Ling; Wu, Jong-Wuu - In: Mathematics and Computers in Simulation (MATCOM) 81 (2011) 6, pp. 1177-1189
Process capability indices (PCIs) are used to measure process potential and performance. This study constructs an uniformly minimum variance unbiased estimator (UMVUE) of the lifetime performance index based on the upper record values for Weibull lifetime model. Then the UMVUE of the lifetime...