Ge, Jialin; Bedeaux, D.; Simon, J.M.; Kjelstrup, S. - In: Physica A: Statistical Mechanics and its Applications 385 (2007) 2, pp. 421-432
Integral relations were used to predict interface film transfer coefficients for evaporation and condensation. According to these, all coefficients can be calculated for one-component systems, using the thermal resistivity and the enthalpy profile through the interface. The expressions were...
