Robert, M.; Reaney, I.; Stadelmann, P. - In: Physica A: Statistical Mechanics and its Applications 229 (1996) 1, pp. 47-52
The interface separating two-dimensional phases close to a critical point is observed in the ferroelectric BaZrxTi1−xO3 by transmission electron microscopy. The temperature dependence of the interfacial thickness is determined and compared with theoretical predictions.
