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Estimation of the survivor model by nonparametric maximum likelihood, maximum penalized likelihood and simulation based estimation

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Stochastic panel frontiers : a semiparametric approach

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Semiparametric approaches to stochastic panel frontiers with applications in the banking industry

Adams, Robert M.; Berger, Allen N.; Sickles, Robin C. - In: Journal of business & economic statistics : JBES ; a … 17 (1999) 3, pp. 349-358

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Semiparametric-efficient estimation of AR(1) panel data models

Park, Byeong U.; Sickles, Robin C.; Simar, Léopold - In: Journal of econometrics 117 (2003) 2, pp. 279-309

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Specification of distance functions using semi- and nonparametric methods with an application to the dynamic performance of Eastern and Western European air carriers

Sickles, Robin C.; Good, David H.; Getachew, Lullit - In: Journal of productivity analysis 17 (2002) 1/2, pp. 133-155

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Panel estimators and the identification of firm-specific efficiency levels in parametric, semiparametric and nonparametric settings

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Advances in Applied Econometrics : Celebrating Peter Schmidt's Legacy

Kumbhakar, Subal (ed.); Sickles, Robin C. (ed.); … - 2024

Chapter 1. Introduction -- Chapter 2. Robust Dynamic Space–time Panel Data Models Using εε-contamination: An Application to Crop Yields and Climate Change -- Chapter 3. Unbiased Estimation of the OLS Covariance Matrix When the Errors are Clustered -- Chapter 4. Refined GMM Estimators for...

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Semi-nonparametric spline modifications to the Cornwell-Schmidt-Sickles estimator : an analysis of US banking productivity

Almanidis, Pavlos; Karagiannēs, Giannēs; Sickles, Robin C. - In: Empirical economics : a journal of the Institute for … 48 (2015) 1, pp. 169-191

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Semiparametric efficient estimation of dynamic panel data models

Park, Byeong U.; Sickles, Robin C.; Simar, Léopold - In: Journal of econometrics 136 (2007) 1, pp. 281-301

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Direction selection in stochastic directional distance functions

Layer, Kevin; Johnson, Andrew L.; Sickles, Robin C.; … - In: European journal of operational research : EJOR 280 (2020) 1, pp. 351-364

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