Narrow search
Showing 1 - 10 of 26
Cover Image
Smooth minimum distance estimation and testing with conditional estimating equations : uniform in bandwidth theory
Lavergne, Pascal; Patilea, Valentin - In: Journal of econometrics 177 (2013) 1, pp. 47-59
Persistent link: https://www.econbiz.de/10010189879
Cover Image
One for all and all for one : regression checks with many regressors
Lavergne, Pascal; Patilea, Valentin - In: Journal of business & economic statistics : JBES ; a … 30 (2012) 1, pp. 41-52
Persistent link: https://www.econbiz.de/10009558973
Cover Image
Breaking the curse of dimensionality in nonparametric testing
Lavergne, Pascal; Patilea, Valentin - In: Journal of econometrics 143 (2008) 1, pp. 103-122
Persistent link: https://www.econbiz.de/10003722594
Cover Image
Breaking the Curse of Dimensionality in Nonparametric Testing
Lavergne, Pascal; Patilea, Valentin - 2006
Persistent link: https://www.econbiz.de/10003422318
Cover Image
One for all and all for one : regression checks with many regressors
Lavergne, Pascal - 2007
Persistent link: https://www.econbiz.de/10003592154
Cover Image
An equality test across nonparametric regressions
Lavergne, Pascal - 1998
Persistent link: https://www.econbiz.de/10000996316
Cover Image
An equality test across nonparametric regressions
Lavergne, Pascal - In: Journal of econometrics 103 (2001) 1/2, pp. 307-344
Persistent link: https://www.econbiz.de/10001585369
Cover Image
Model equivalence tests for overidentifying restrictions
Lavergne, Pascal - 2015
Persistent link: https://www.econbiz.de/10011302281
Cover Image
On semiparametric M-estimation in single-index regression
Delecroix, Michel; Hristache, Marian; Patilea, Valentin - 2004
Persistent link: https://www.econbiz.de/10002553921
Cover Image
Nonparametric lack-of-fit tests for parametric mean-regression model with censored data
Lopez, Olivier; Patilea, Valentin - 2007
Persistent link: https://www.econbiz.de/10003588049