Little research currently exists on a vulnerability line that distinguishes the poor population from the population that is not poor but that still faces significant risk of falling back into poverty. This paper attempts to fill this gap by proposing vulnerability lines that can be...

Poverty estimates based on cross-section data provide static snapshots of poverty rates. Although a time series of cross-section data can offer some insights into poverty trends, it does not allow for an assessment of dynamics at the household level. Such a dynamic perspective on poverty...

Absent actual panel household survey data, this paper constructs, for the first time, synthetic panel data for more than 20 countries accounting for two-thirds of the population in Sub-Saharan Africa. In this process, the analysis employs repeated cross sections that span, on average, a six-year...

There is an increasingly stronger demand for more frequent and accurate poverty estimates, despite the oftentimes unavailable household consumption data. We offer a review of alternative imputation methods that have been employed to provide poverty estimates in such contexts. These range from...

There is an increasingly stronger demand for more frequent and accurate poverty estimates, despite the oftentimes unavailable household consumption data. This paper offers a review of alternative imputation methods that have been employed to provide poverty estimates in such contexts. These...

Absent actual panel household survey data, this paper constructs, for the first time, synthetic panel data for more than 20 countries accounting for two-thirds of the population in Sub-Saharan Africa. In this process, the analysis employs repeated cross sections that span, on average, a six-year...

Panel data play an important role in producing insights into households’ welfare dynamics and economic transformation processes. Yet, such data are not readily available for a number of countries, particularly developing countries, because they require considerable financial and technical...