Narrow search
Showing 1 - 10 of 28
Cover Image
A more powerful modification of Johansen's cointegration tests
Leybourne, Stephen James; Kim, Tae-hwan; Newbold, Paul - In: Applied economics 40 (2008) 4/6, pp. 725-729
Persistent link: https://www.econbiz.de/10003722969
Cover Image
Testing the Unit root hypothesis against TAR nonlinearity using STAR-based tests
Sollis, Robert - In: Economics letters 112 (2011) 1, pp. 19-22
Persistent link: https://www.econbiz.de/10009242181
Cover Image
On robust trend function hypothesis testing
Harvey, David I.; Leybourne, Stephen James; Taylor, Robert - 2005
Persistent link: https://www.econbiz.de/10002672015
Cover Image
Some new tests for a change in persistence
Taylor, Robert (contributor);  … - In: Economics bulletin : EB (2004)
Persistent link: https://www.econbiz.de/10003074908
Cover Image
An unbiased test for a change in persistence
Leybourne, Stephen James; Taylor, Robert; Kim, Tae-hwan - 2004
Persistent link: https://www.econbiz.de/10002379251
Cover Image
Tests for equal forecast accuracy under heteroskedasticity
Harvey, David I.; Leybourne, Stephen James; Zu, Yang - In: Journal of applied econometrics 39 (2024) 5, pp. 850-869
Persistent link: https://www.econbiz.de/10015156787
Cover Image
Testing for long memory
Harris, David; McCabe, Brendan Peter Martin; Leybourne, … - In: Econometric theory 24 (2008) 1, pp. 143-175
Persistent link: https://www.econbiz.de/10003894122
Cover Image
On the behavior of fixed-b trend break tests under fractional integration
Iacone, Fabrizio; Leybourne, Stephen James; Taylor, Robert - In: Econometric theory 29 (2013) 2, pp. 393-418
Persistent link: https://www.econbiz.de/10009760001
Cover Image
Asymptotic behaviour of tests for a unit root against an explosive alternative
Harvey, David I.; Leybourne, Stephen James - In: Economics letters 122 (2014) 1, pp. 64-68
Persistent link: https://www.econbiz.de/10010393959
Cover Image
On robust trend function hypothesis testing
Harvey, David I. (contributor);  … - In: Studies in nonlinear dynamics and econometrics : SNDE ; … 10 (2006) 2, pp. 1-19
Persistent link: https://www.econbiz.de/10003286543