Berthier, S.; Fagnent, S.; Sauques, L.; Sainte … - In: Physica A: Statistical Mechanics and its Applications 241 (1997) 1, pp. 138-145
Aluminum/aluminiu nitride (A1/A1N) cerment films have been deposited by radio-frequency cosputtering. Determination of percolation threshold qc = 0.22 was derived from microstructural analysis and conductivity measurements. SIMS measurements also revealed inhomogeneities of atomic composition...
