Im, KyungSo; Lee, Junsoo; Tieslau, Margie A. - 2005
This paper proposes a new panel unit-root test based on the Lagrangian multiplier (LM) principle. We show that the asymptotic distribution of the new panel LM test is not affected by the presence of structural shifts. This result holds under a mild condition that N/T-k, where k is any finite...