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This paper proposes a panel unit root test for micropanels with short time dimension (T) and large cross section (N). There are several distinctive features of this test. First, the test is based on a panel AR(1) model, which allows for cross-sectional dependency, which is introduced by the...
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This paper re-evaluates the key past results of unit root tests, emphasizing that the use of a conventional level of significance is not in general optimal due to the test having low power. The decision-based significance levels for popular unit root tests, chosen using the line of enlightened...
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