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Special issue: Measuring the economic effects of competition law enforcement
Don, Henk
(
contributor
);
Kemp, Ron
(
contributor
); …
-
2008
Persistent link: https://www.econbiz.de/10003790768
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Patents and technical standards
Verbruggen, Johan P.
;
Lõrincz, Anna
- In:
IIC : international review of intellectual property and …
33
(
2002
)
2
,
pp. 125-154
Persistent link: https://www.econbiz.de/10001657833
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3
Re-exports : international comparison and implications for performance indicators
Mellens, Martin C.
;
Noordman, Herman
;
Verbruggen, Johan P.
-
2007
Persistent link: https://www.econbiz.de/10003490317
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4
Wederuitvoer : internationale vergelijking en gevolgen voor prestatie-indicatoren
Mellens, M. C.
;
Noordman, Herman
;
Verbruggen, Johan P.
-
2007
Persistent link: https://www.econbiz.de/10003482569
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