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An improved approach for constructing lower confidence bound on process yield
Wu, Chien-Wei; Liao, Mou-Yuan; Chen, James C. - In: European Journal of Industrial Engineering 6 (2012) 3, pp. 369-390
Process yield, the percentage of processed product units passing inspection, is a standard numerical measure of process performance in manufacturing industry. Based on the expression of process yield, Boyles (1994) presented a yield-measure index, S<SUB align="right"><SMALL>pk</SMALL></SUB>, for normally distributed processes. In...</small></sub>
Persistent link: https://www.econbiz.de/10010667491
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Assessing process incapability when collecting data from multiple batches
Liao, Mou-yuan - In: International journal of production research 53 (2015) 7, pp. 2041-2054
Persistent link: https://www.econbiz.de/10010510154
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Comparisons of frequentist and Bayesian inferences for interval estimation on process yield
Wu, Chien-wei; Shu, Ming-Hung; Huang, Ting-Ying; Hsu, Bi-Min - In: Journal of the Operational Research Society 73 (2022) 12, pp. 2694-2705
Persistent link: https://www.econbiz.de/10013533319
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A novel approach for measuring the maximum process-lons information in multiple production line conditions
Wu, Chien-wei; Shu, Ming-hung - In: International journal of production research 50 (2012) 14, pp. 3809-3820
Persistent link: https://www.econbiz.de/10009619044