Audrino, Francesco; Hu, Yujia - In: Econometrics : open access journal 4 (2016) 1, pp. 1-24
return and volatility processes. Using recently-developed methodologies to detect jumps from high frequency price data, we … "good" and "bad", as well as into continuous and discontinuous risks. Using a long history of the S & P500 price index, we …