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simulation study
Adjusted profile likelihood
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Testing for Varying Dispersion in Exponential Family Nonlinear Models
Wei, Bo-Cheng
;
Shi, Jian-Qing
;
Fung, Wing-Kam
;
Hu, Yue-Qing
- In:
Annals of the Institute of Statistical Mathematics
50
(
1998
)
2
,
pp. 277-294
Persistent link: https://www.econbiz.de/10005395817
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