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Optimal burn-in for maximizing reliability of repairable non-series systems

Kim, Kyungmee O.; Kuo, Way - In: European Journal of Operational Research 193 (2009) 1, pp. 140-151

Burn-in is a manufacturing process applied to products to eliminate early failures in the factory before the products reach the customers. Various methods have been proposed for determining an optimal burn-in time of a non-repairable system or a repairable series system, assuming that system...

Persistent link: https://www.econbiz.de/10005277464

Optimal pricing for a target profit: Case study on a veterinary diagnostic laboratory

Kuo, Way; Jain, Gautam - In: International Journal of Production Economics 54 (1998) 1, pp. 77-86

Persistent link: https://www.econbiz.de/10005188615

Reliability Importance and Invariant Optimal Allocation

Lin, Fen-Hui; Kuo, Way - In: Journal of heuristics 8 (2002) 2, pp. 155-172

Persistent link: https://www.econbiz.de/10008216494

A model-based clustering approach to the recognition of the spatial defect patterns produced during semiconductor fabrication

Yuan, Tao; Kuo, Way - In: IIE transactions / Institute of Industrial Engineers, … 40 (2008) 2, pp. 93-101

Persistent link: https://www.econbiz.de/10007896284

Yield prediction via spatial modeling of clustered defect counts across a wafer map

Bae, Suk Joo; Hwang, Jung Yoon; Kuo, Way - In: IIE transactions / Institute of Industrial Engineers, … 39 (2007) 12, pp. 1073-1084

Persistent link: https://www.econbiz.de/10007873798

Degradation models and implied lifetime distributions

Bae, Suk Joo; Kuo, Way; Kvam, Paul H. - In: Reliability engineering & system safety 92 (2007) 5, pp. 601-608

Persistent link: https://www.econbiz.de/10007589199

Optimal burn-in for maximizing reliability of repairable non-series systems

Kim, Kyungmee O.; Kuo, Way - In: European journal of operational research : EJOR 193 (2009) 1, pp. 140-151

Persistent link: https://www.econbiz.de/10008161296

Spatial defect pattern recognition on semiconductor wafers using model-based clustering and Bayesian inference

Yuan, Tao; Kuo, Way - In: European journal of operational research : EJOR 190 (2008) 1, pp. 228-240

Persistent link: https://www.econbiz.de/10007988355

Detection and classification of defect patterns on semiconductor wafers

Wang, Chih-Hsuan; Kuo, Way; Bensmail, Halima - In: IIE transactions / Institute of Industrial Engineers, … 38 (2006) 12, pp. 1059-1068

Persistent link: https://www.econbiz.de/10007301820

Model-based clustering for integrated circuit yield enhancement

Hwang, Jung Yoon; Kuo, Way - In: European journal of operational research : EJOR 178 (2007) 1, pp. 143-153

Persistent link: https://www.econbiz.de/10007391385