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Yield prediction via spatial modeling of clustered defect counts across a wafer map

Bae, Suk Joo; Hwang, Jung Yoon; Kuo, Way - In: IIE transactions / Institute of Industrial Engineers, … 39 (2007) 12, pp. 1073-1084

Persistent link: https://www.econbiz.de/10007873798

Multi-step ART1 algorithm for recognition of defect patterns on semiconductor wafers

Choi, Gyunghyun; Kim, Sung-hee; Ha, Chunghun; Bae, Suk Joo - In: International journal of production research 50 (2012) 12, pp. 3274-3287

Persistent link: https://www.econbiz.de/10009576046

A probability model for strategic bidding on "the price is right"

Kvam, Paul H. - In: Decision analysis : a journal of the Institute for … 15 (2018) 4, pp. 195-207

Persistent link: https://www.econbiz.de/10011964126

Degradation pattern prediction of a polymer electrolyte membrane fuel cell stack with series reliability structure via durability data of single cells

Bae, Suk Joo; Kim, Seong-Joon; Lee, Jin-Hwa; Song, Inseob; … - In: Applied Energy 131 (2014) C, pp. 48-55

The insufficient long-term durability of polymer electrolyte membrane fuel cell (PEMFC) stacks has been blocking commercialization of PEMFC technologies. An accelerated degradation test (ADT) is needed to facilitate the PEMFC development process by reducing the testing time. We propose an ADT...

Persistent link: https://www.econbiz.de/10010906278

Change-point detection in failure intensity: A case study with repairable artillery systems

Bae, Suk Joo; Mun, Byeong Min; Kim, Kyung Yong - In: Computers & industrial engineering : CAIE ; an … 64 (2013) 1, pp. 11-18

Persistent link: https://www.econbiz.de/10010062108

A Superposed Log-Linear Failure Intensity Model for Repairable Artillery Systems

Mun, Byeong Min; Bae, Suk Joo; Kvam, Paul H - In: Journal of quality technology : a quarterly journal of … 45 (2013) 1, pp. 100-115

Persistent link: https://www.econbiz.de/10010067302

A Genetic‐Based Iterative Quantile Regression Algorithm for Analyzing Fatigue Curves

Park, Jong In; Kim, Norman; Bae, Suk Joo - In: Quality and reliability engineering international 28 (2012) 8, pp. 897-909

Persistent link: https://www.econbiz.de/10010046802

Cost-effective degradation test plan for a nonlinear random-coefficients model

Kim, Seong-Joon; Bae, Suk Joo - In: Reliability engineering & system safety 110 (2013), pp. 68-79

Persistent link: https://www.econbiz.de/10010053916

Multi-step ART1 algorithm for recognition of defect patterns on semiconductor wafers

Choi, Gyunghyun; Kim, Sung-Hee; Ha, Chunghun; Bae, Suk Joo - In: International journal of production research : American … 50 (2012) 12, pp. 3274-3288

Persistent link: https://www.econbiz.de/10009985751

Estimating Load-Sharing Properties in a Dynamic Reliability System

Kvam, Paul H.; Pena, Edsel A. - In: Journal of the American Statistical Association 100 (2005) March, pp. 262-272

Persistent link: https://www.econbiz.de/10005734013